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The Cross Section AFM/STM Mounts and AFM/STM Sample Holders offer a convenient way to clamp and position cross sectional samples for AFM imaging
High aspect ratio probe based upon Bruker technology and made from our TESP
storage boxes
The DDLTESP-V2 probe provides:
10KHZ DESCRIPTION
Carbon Mount, 25.4mm dia. x 3.2mm pin, Grooved head Gold Coated The Cross Section AFM/STM MountsDESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard
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