Pay in 4 interest-free payments of $55.85 Learn more
Ships within 48 hours · Estimated delivery Aug 28 - Sep 2
Both coatings are available on 50nm and 200nm PELCO® Silicon Nitride Membranes with a 0
electrically conductive tip that is ideal for Electrical Force Microscopy (EFM)
2 heights available
15487 - Low Profile PELCO® Single 1/2" FIB Sample and Grid Holder
Tip Geometry: Standard (Steep) Tip Height: 3 - 6 Tip Radius (Nom): <30
Multi75GD-G Select Quantity:10 per set Both coatings are available onGold Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) in air and liquids. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is
US$ 40.00
US$ 118.00
US$ 130.00
US$ 140.00
US$ 130.00
US$ 160.00
