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Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm
Check that sample height (as well as length and width) is compatible with compartment depth
667-300-AU-100 - Ultrathin Carbon on Quantifoil®
MSDS (159KB PDF)
Also included are glass and metal spacers for chamber height adjustment
Ø12.7mm 10º / 90º SEM Mount for TFS/FEI, TESCAN, ZEISS (also for Philips, LEO, Cambridge, Leica, CamScan). Aluminum, grooved edge, 6mm pin height. Wear Resistant Each probe tip is individuallyDESCRIPTION FEI, TESCAN, ZEISS (also for Philips, LEO, Cambridge, Leica, CamScan) aluminum, grooved edge, 12. 7mm. Note: Sold in 10 50 100 packs. Prod # Description Unit 16275 12. 7mm Diameter 10 90 Mount, shorter 6mm pin each
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