2000 lines/mm Cross Line Grating Replica Tweezers 100nm-Wide-Spike @ 1µm

100nm-Wide-Spike @ 1µm

Usability: The calibrated pattern covers the entire chip

Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images

PELCO® Pinpointer Grids

UNCALIBRATED

2000 lines/mm Cross Line Grating Replica Tweezers 100nm-Wide-Spike @ 1µmDESCRIPTION 677 AFM X Y Cross Line Grating Replica, 2000 lines mm, Cellulose Acetate, mounted on 12mm AFM STM Specimen Disc 677 AFM 10 X Y Cross Line Grating Replica, 2000 lines mm, Cellulose Acetate, mounted on 10mm AFM STM Specimen Disc 677 STM X Y Cross Line Grating Replica, 2000 lines mm, Carbon Au Pd Coated, mounted on 12mm AFM STM Specimen Disc 2,000 lines mm cross line grating replica is suitable for X Y calibration. The replicas have well