DAFMCH Dektak METAL PROBE

METAL PROBE

Standard Height Sample Holder

-- For Scanning Capacitance Mode only

Replacement scanner springs for all V and VLH type scanners

Round Post Tips for Depth Metrology

DAFMCH Dektak METAL PROBEContact AFM & TappingMode (air) cantilever holder DESCRIPTION This Contact AFM & TappingMode (air) cantilever holder features piezo tip drive and tip bias connection. This holder supports Electrostatic Force Microscopy (EFM), Magnetic Force Microscopy (MFM), and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs. Included with the Dimension Series AFMs, but available as a spare part. A non magnetic version is also