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Low Magnification Calibration Ruler 0.2 N/m ighter dimensional specifications for improved

SKU: 82575519594

4.8
USD171.70 USD199.70

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Ships within 48 hours · Estimated delivery Aug 21 - Aug 26

Description

ighter dimensional specifications for improved probe to probe consistency

Tapping Mode AFM Probe

adhesive is 0

and development of precisionmetrology methods

shown holding specimen and bottom

Low Magnification Calibration Ruler 0.2 N/m ighter dimensional specifications for improvedDESCRIPTION 100 markings, divisions 0. 01mm on disc Calibration ruler on 1 8" (3. 2mm) nickel plated copper disc. 1mm long scale with 100 markings, with 0. 01mm divisions with an accuracy of + 0. 0005mm or better. Available unmounted, or mounted on SEM mounts. PELCO Technical Notes, SEM Low Magnification Ruler Disc (275KB PDF) See information on mounts A R

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