145nm Pitch Calibration Standard for AFM 50 kHz Super sharp tip for highest

Super sharp tip for highest resolution combined with intermediate spring constant for applications including:

Sample to demonstrate imaging work function differences for KPFM

Chromium adhesion layer thickness: 5nm

MFM starter kit for MultiMode SPM DESCRIPTION

Requires the CAFM module

145nm Pitch Calibration Standard for AFM 50 kHz Super sharp tip for highestDESCRIPTION 145nm AFM Reference Standard, Certified, Non traceable, Mounted on disk: 145nm Very High Resolution AFM Reference Standard on 12mm steel disk 145nm AFM Reference Standard, Certified, Non traceable, Unmounted: 145nm Very High Resolution AFM Reference Standard, Unmounted Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements. Period: 145nm pitch nominal, one dimensional array. Accuracy is +