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Materials are Cu
Non-Magnetic Sample Holder for CP-II DESCRIPTION
16 N/m nominal
***Note: Bruker's new MESP-V2 probe replaces the legacy MESP probe
Innova Contact Mode Probe Cartridge holds pre-mounted probes
SiC-STEP Calibration Samples 300 Mesh Materials are CuDESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
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