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PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM) Soft Tapping Mode Feedback loop enables precise and

SKU: 66463764393

4.9
EUR285.73 EUR334.73

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Ships within 48 hours · Estimated delivery Aug 24 - Aug 29

Description

Feedback loop enables precise and consistent coating thickness

Made of strong reinforced plastic

Bar Width 33µm

56-75 - Highest Grade V1 Mica

the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast

PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM) Soft Tapping Mode Feedback loop enables precise andDESCRIPTION inexpensive characterization of instrument performance The NiOx Test Specimen has been developed for advanced analytical TEM's equipped with X Ray Micro Analysis Systems (EDX) and or Electron Energy Loss Spectrometers (EELS) to characterize instrument performance. It consists of a 55nm layer of NiOx on a 25nm carbon support film on a 200 mesh Mo TEM grid. The NiOx Test Specimen is valuable in at least three ways: When evaluating TEM's and

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