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mouted on a 200M Cu grid
electrostatic force microscopy (EFM)
Set screw vise with an open slot of 10mm (
#15342-4 Universal Spring Loaded Vise
75" x 2" x 1
Multi75-G All mouted on a 200M CuStandard Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Standard Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard
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