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Fused silica sample pre-mounted on a 15mm magnetic disk
and other electrical characterization applications
265 Cantilever Geometry: Special Cantilevers Number: 1 Back Side Coating: Reflective Au
Built on the high-performance RFESP-75 AFM probe
8 Cantilever Thickness (RNG): 5
AD-2.8-AS 22 kHz Fused silica sample pre-mounted onSharp Conductive Single Crystal Diamond Probes, 2. 8 N m, 65 kHz, 10 nm ROC, 5 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Sharp Conductive Single Crystal Diamond Probes, 2. 8 N m, 65 kHz, 10 nm ROC, 5 Pack Intermediate spring constant for applications including: Topography imaging in PeakForce Tapping, Tappingmode, and contact mode. Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation. Highly
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