Silicon PELCO® FIB Lift-Out Grid TEM Grids 225 N/m - Probe holder for application

- Probe holder for application module-equipped MultiMode SPMs

Electron microscopy - SEM

Aspect ratio of 10:1 at 1um from tip apex

Max Width = 32 nm

All cantilevers have less than +/- 2 deg bend

Silicon PELCO® FIB Lift-Out Grid TEM Grids 225 N/m - Probe holder for applicationDESCRIPTION The thickness of the silicon lift out grids is 100m which makes them compatible with all standard TEM holders. Perfect half circular shape which fits nicely in the TEM grid holder. Debris free, metal free lift out grids which readily bond with Pt to attach the lamellas. Straight edges, similar to the Cu and Mo grids; easy to handle. B doped, conductive silicon minimizes charging during sample preparation and TEM imaging. Available with