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Resonant frequency 55 kHz in air
AFM users with Bruker's latest electrical characterization techniquesbased upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes
100nm Wide Spike @ 1µm
nanoscratching
Titanium roughness sample DESCRIPTION
00-107-0142 Thermal Resonant frequency 55 kHz inChip carrier with lead for unmounted cantilever, CP II DESCRIPTION Chip carrier with lead, CPII Innova; The unmounted probe chip carrier with lead provides mounting of unmounted probes on a metallic adaptor that interfaces to the CPII Innova probe cartridge. The wire connected to the chip carrier allows the tip bias to use external volatege sources. This part is included in the Electrostatic Force Microscopy (EFM) Option.
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