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APSH-0050 180 kHz Cantilever Geometry: Rectangular Cantilevers Number:

SKU: 43528230864

4.7
USD460.38 USD482.38

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Description

Cantilever Geometry: Rectangular Cantilevers Number: 1

12mm DESCRIPTION

The nominal stress specification for NP probes is less than 4deg of cantilever bend

5 Back Angle: 1

the ScanAsyst-Air-HPI-30 provides accurate nanomechanical mapping on very soft samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants

APSH-0050 180 kHz Cantilever Geometry: Rectangular Cantilevers Number:CP II sample bias holder DESCRIPTION Sample bias holder for CPII Innova has connectors to apply an external sample bias voltage. This type of sample holder is used to hold a flat sample, such as a piece of semiconductor material. The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option.

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