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AD‌-40-P40 Automated AFM This AFM probe is unmounted

SKU: 40346853803

4.1
USD906.25 USD926.25

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Ships within 48 hours · Estimated delivery Aug 29 - Sep 3

Description

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2

5+/-5 Tip Radius (Nom): 40 Tip Set Back( RNG): 15-25 Tilt Compensation: 7 +/- 1

Inset showing a single particle averaging of the bR trimer

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 15 Tip Radius (Max): <10 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3

25 Cantilever Thickness (RNG): 0

AD‌-40-P40 Automated AFM This AFM probe is unmountedDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 40nm base diameter, combined with a high 40N m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM. Tip Geometry:

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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