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high-amplitude force imaging in air
This is used with the NanoScope tip-evaluation software
Observation of rugged samples:The tip is thin with the tip angle of 35 degrees
Tipless cantilevers for Contact Mode or Fluid TappingMode imaging and force measurement with a variety of extremely low spring constants for high force sensitivity
please see model SSRM-DIA
VGRP-UM Unmounted Instrument high-amplitude force imaging in airCalibration artifact: 180nm step height, 10m pitch DESCRIPTION Calibration artifact, 180nm step height, 10m pitch. This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance. The silicon die with patternedlayer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST. Replaces model STR10 1800P.
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