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VITA-TS-STHM 6 N/m combined with a high 40N/m

SKU: 29556318439

4.2
USD181.25 USD208.25

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Ships within 48 hours · Estimated delivery Sep 1 - Sep 6

Description

combined with a high 40N/m spring constant

electrically conductive tip that is ideal for Electrical Force Microscopy (EFM)

electrically conductive tip that is ideal for various electrical characterization applications

Max Overhang = 30 nm

constant edge radius maintains resolution over tip life

VITA-TS-STHM 6 N/m combined with a high 40N/mVITA Scanning Thermal Microscopy, SThM, test sample DESCRIPTION VITA Scanning Thermal Microscopy, SThM, test sample. Allows user to become familair with SThM technique on Veeco SPM.

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
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