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PR-EX-SNM-B-10 300 kHz not for Conductive or Tunneling

SKU: 24922927817

4.5
USD507.50 USD553.50

Pay in 4 interest-free payments of $126.88 Learn more

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USA
  • USA
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Ships within 48 hours · Estimated delivery Aug 30 - Sep 4

Description

not for Conductive or Tunneling AFM

200 mesh with alphabetic and number codingReference Index Grid

Auger and other applications

MFM Probes

Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air

PR-EX-SNM-B-10 300 kHz not for Conductive or TunnelingDESCRIPTION 10 pack of probes for use in the nanoIR2 s system for AFM imaging in tapping mode and for use with the scattering SNOM technique. Microfabricated platinum iridium coated silicon probes with single cantilever ~125 microns long. Pre mounted on half washer mounts for easy exchange in the nanoIR head.

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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