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Calibration Specimen for Scanning Tunneling Microscope
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electrically conductive tip
PELCO® High Performance Silver Paste
The Gilder grids feature well defined grid bars
Block Test Gratings for Z-axis PeakForce Tapping Enabled Bruker AFM Calibration Specimen for Scanning TunnelingDESCRIPTION Selection of 3 block type test gratings with different step heights intended for Z axis calibration of scanning probe microscopes and linearity measurements. Structure: Si Wafer with SiO2 layer for grating Pattern type: 1 Dimensional (in Z axis direction) Step heights: 201. 5nm for TGZ 20 1102nm for TGZ 100 5203nm for TGZ 500 Period: 3 0. 01m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 3 x 3mm Note: Values for step heights
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