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order INCL-3
and "C" and "D" cantilevers on the other side of the probe
Sensitive nanoelectrical measurements with highly conductive coating
5N/m nominal
IC devices and so on
CLST-PTBO 3-degree Automated AFM (InSight 3DAFM order INCL-320mm cut Platinum Iridium, 0. 50mm diameter DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of STM Probes Precision cut Platinum Iridium wire for Scanning Tunneling Microscopy. Unmounted for CPII Innova AFMs. Quantity=10 These tips are formed from platinum iridium wire and cut at the end to form the tip. The wire is 0. 5mm in diameter and is recommended for Veeco's Innova and CP II SPMs. Tip Geometry: Solid Wire Cantilever Geometry:
