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Multi75DLC Pin Mount SEM Specimen Holders Gold Sample

SKU: 1689128407

4.2
USD307.40 USD331.40

Pay in 4 interest-free payments of $76.85 Learn more

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Ships within 48 hours · Estimated delivery Aug 6 - Aug 11

Description

Gold Sample

The AFM/STM discs are retrieved by using the convenient PELCO® AFM Disc Pickup Tool

Pelcotec™ CDMS Critical Dimension Magnification Standard

high purity GE124 quartz

Tip Geometry: Standard Tip Height: 10 - 15 Front Angle: 25+/-2 Back Angle: 15+/-2 Side Angle: 17

Multi75DLC Pin Mount SEM Specimen Holders Gold SampleDiamond Like Carbon Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM). High durability and hydrophobicity due to Diamond Like Carbon coating on tip side of the cantilever. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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