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PELCO® 1" FIB Sample and Grid Holder Tescan A two-component polymer sample mounted

SKU: 12123880967

4.2
EUR234.55 EUR279.55

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Ships within 48 hours · Estimated delivery Sep 5 - Sep 10

Description

A two-component polymer sample mounted on a 12mm steel sample puck for training researchers in the use of HarmoniX mode

38 and 55mm

PELCO® ESD Safe PTFE Wafer Handling Tweezers

Screws used are 4-40 x 3/8 Thumb

position the wafer substrate on the film and press down with firm pressure to insure adhesion

PELCO® 1" FIB Sample and Grid Holder Tescan A two-component polymer sample mountedDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
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