300nm Pitch High Resolution 2D Calibration Standard for SEM Fluid TappingMode G2000HS: Pitch 12

G2000HS: Pitch 12

and afm+ that allows room for taller samples to be placed on the stage for analysis

Packaging:

they are round

Tip-evaluation software provides on-command "worst case" probe-shape diagnosis based on scanning of this roughness sample

300nm Pitch High Resolution 2D Calibration Standard for SEM Fluid TappingMode G2000HS: Pitch 12DESCRIPTION 300nm 2D SEM, Auger and FIB Reference Standard, Certified, Non traceable, Unmounted or Mounted Period: 300nm pitch nominal, two dimensional array accurate to 1nm. Calibration certificate will give the actual pitch of the standard. Surface Structure: Aluminum bumps on Silicon, 4x3mm die: Bump height (about 50nm) and width (about 150nm) not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable area